Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin films

Thin films of the three members of the superconducting series , n = 1,2,3, were prepared by diode sputtering. X-ray characterization shows that all the films are single phase and c-axis oriented and in addition they are epitaxially grown. The latter is found by x-ray pole-figure measurements taken with a four-circle diffractometer. These are emphasized in this work. AC susceptibility measurements show that, while the 2201 films are not superconducting until 4 K, the transition temperatures of the 2212 films are 82 K - 90 K and of the 2223 films 84 K - 89 K.

XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films

Copyright (c) 1997 Elsevier Science B.V. All rights reserved. Micro Raman characterization is performed on high quality thin films of Bi 2 Sr 2 CuO 6+x (2201), Bi 2 Sr 2 CaCu 2 O 8+x (2212), Bi 2 Sr 2 Ca 2 Cu 3 O 10+x (2223) made by dc-sputtering. Single crystal X-ray measurements reveal the full epitaxy of the films, which allows for polarized Raman spectra to be obtained.

Poster contributions