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RESEARCH PRODUCT
XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films
E. LiarokapisN. PoulakisM HoliastouDimitrios PallesH. AdrianU. FreyD. Niarchossubject
Materials scienceAnalytical chemistryEnergy Engineering and Power TechnologyLattice vibrationCondensed Matter PhysicsEpitaxyElectronic Optical and Magnetic MaterialsCharacterization (materials science)symbols.namesakeMicro ramansymbolsCathode sputteringElectrical and Electronic EngineeringThin filmRaman spectroscopySingle crystaldescription
Copyright (c) 1997 Elsevier Science B.V. All rights reserved. Micro Raman characterization is performed on high quality thin films of Bi 2 Sr 2 CuO 6+x (2201), Bi 2 Sr 2 CaCu 2 O 8+x (2212), Bi 2 Sr 2 Ca 2 Cu 3 O 10+x (2223) made by dc-sputtering. Single crystal X-ray measurements reveal the full epitaxy of the films, which allows for polarized Raman spectra to be obtained.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1997-08-01 | Physica C: Superconductivity |