0000000000648477

AUTHOR

M Holiastou

showing 2 related works from this author

Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin films

1997

Thin films of the three members of the superconducting series , n = 1,2,3, were prepared by diode sputtering. X-ray characterization shows that all the films are single phase and c-axis oriented and in addition they are epitaxially grown. The latter is found by x-ray pole-figure measurements taken with a four-circle diffractometer. These are emphasized in this work. AC susceptibility measurements show that, while the 2201 films are not superconducting until 4 K, the transition temperatures of the 2212 films are 82 K - 90 K and of the 2223 films 84 K - 89 K.

SuperconductivityMaterials scienceMetals and AlloysAnalytical chemistryPole figureCondensed Matter PhysicsMagnetic susceptibilitySputteringCavity magnetronMaterials ChemistryCeramics and CompositesTexture (crystalline)Electrical and Electronic EngineeringThin filmDiffractometerSuperconductor Science and Technology
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XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films

1997

Copyright (c) 1997 Elsevier Science B.V. All rights reserved. Micro Raman characterization is performed on high quality thin films of Bi 2 Sr 2 CuO 6+x (2201), Bi 2 Sr 2 CaCu 2 O 8+x (2212), Bi 2 Sr 2 Ca 2 Cu 3 O 10+x (2223) made by dc-sputtering. Single crystal X-ray measurements reveal the full epitaxy of the films, which allows for polarized Raman spectra to be obtained.

Materials scienceAnalytical chemistryEnergy Engineering and Power TechnologyLattice vibrationCondensed Matter PhysicsEpitaxyElectronic Optical and Magnetic MaterialsCharacterization (materials science)symbols.namesakeMicro ramansymbolsCathode sputteringElectrical and Electronic EngineeringThin filmRaman spectroscopySingle crystalPhysica C: Superconductivity
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