0000000000660982

AUTHOR

L.a. Dissado

showing 1 related works from this author

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage

2008

Several degradation mechanisms may affect polymeric insulation system reliability. Some authors postulate that, even in a perfect dielectric, nanoscale cavities can enlarge due to various mechanisms (from mechanical fatigue to lowering of the degradation reaction energy barrier) up to a point where highly energetic phenomena, which bring about breakdown, can be incepted. Other authors are more focused on the inherent limits of manufacturing processes, which leave cavities within the insulation system whose size is large enough to cause electron avalanches, thus a measurable partial discharge (PD) activity, from the time the system is put in service or as a function of external factors (e.g.…

Reliability (semiconductor)Materials scienceInsulation systemThermalPartial dischargeForensic engineeringDielectricElectrical treeingComposite materialVoltageDegradation (telecommunications)2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
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