0000000000668472
AUTHOR
Jeff Beeman
EBIT diagnostics using X-ray spectra of highly ionized Ne
We have carried out a detailed analysis of highly ionized neon spectra collected at the NIST EBIT using an NTD germanium X-ray microcalorimeter developed at the Harvard-Smithsonian Center for Astrophysics [Nucl. Instr. and Meth. A 444 (2000) 156]. Our attention was focused especially on the Ne IX He-like triplet to check electron density diagnostics through the intercombination/forbidden line ratio. We have investigated possible effects of the ion dynamics on the plasma emission line intensities, looking at the dependence of the count-rate and the charge state distribution on the electron beam energy and current. The temperature and spatial distribution of the neon ions, and hence the overl…
NTD-GE-based microcalorimeter performance
Our group has been developing x-ray microcalorimeters consisting of neutron transmutation doped (NTD) germanium thermistors attached to superconducting tin absorbers. We discuss the performance of single pixel x-ray detectors, and describe an array technology. In this paper we describe the read-out circuit that allows us to measure fast signals in our detectors as this will be important in understanding the primary cause of resolution broadening. We describe briefly a multiplexing scheme that allows a number of different calorimeters to be read out using a single JFET. We list the possible causes of broadening and give a description of the experiment which best demonstrates the cause of the…