0000000000686711
AUTHOR
R. Ammendola
Search for heavy neutrinos at the NA48/2 and NA62 experiments at CERN
© The Authors, published by EDP Sciences. The NA48/2 experiment at CERN has collected large samples of charged kaons decaying into a pion and two muons for the search of heavy nuetrinos. In addition, its successor NA62 has set new limits on the rate of charged kaon decay into a heavy neutral lepton (HNL) and a lepton, with = e, µ, using the data collected in 2007 and 2015. New limits on heavy neutrinos from kaon decays into pions, muons and positrons are presented in this report.
Search for K+→ π+νν¯ at NA62
Flavour physics is one of the most powerful fields for the search of new physics beyond the Standard Model. The kaon sector with the rare decay K+ → π+νν̅ provides one of the cleanest and most promising channels. NA62, a fixed target experiment at the CERN SPS, aims to measure BR (K+ → π+νν̅) with 10% precision to test the Standard Model validity up to an energy scale of hundreds of TeV. NA62 had dedicated data taking for the K+ → π+νν̅ measurement in 2016 and 2017 and will continue in 2018. Here preliminary results on a fraction of 2016 dataset are presented. The analysis of the complete 2016 data sample is expected to achieve the SM sensitivity.
Thomas Devlin. biochimica con aspetti clinico-farmaceutici. Capitolo 25. digestione e assorbimento dei principali nutrienti.
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Sensitivity of the Cherenkov Telescope Array to a dark matter signal from the Galactic centre
Full list of authors: Acharyya, A.; Adam, R.; Adams, C.; Agudo, I.; Aguirre-Santaella, A.; Alfaro, R.; Alfaro, J.; Alispach, C.; Aloisio, R.; Alves Batista, R.; Amati, L.; Ambrosi, G.; Angüner, E. O.; Antonelli, L. A.; Aramo, C.; Araudo, A.; Armstrong, T.; Arqueros, F.; Asano, K.; Ascasíbar, Y. Ashley, M.; Balazs, C.; Ballester, O.; Baquero Larriva, A.; Barbosa Martins, V.; Barkov, M.; Barres de Almeida, U.; Barrio, J. A.; Bastieri, D.; Becerra, J.; Beck, G.; Becker Tjus, J.; Benbow, W.; Benito, M.; Berge, D.; Bernardini, E.; Bernlöhr, K.; Berti, A.; Bertucci, B.; Beshley, V.; Biasuzzi, B.; Biland, A.; Bissaldi, E.; Biteau, J.; Blanch, O.; Blazek, J.; Bocchino, F.; Boisson, C.; Bonneau Arbe…