0000000000706770

AUTHOR

Gupta

showing 2 related works from this author

EVpedia: a community web portal for extracellular vesicles research

2014

Abstract Motivation: Extracellular vesicles (EVs) are spherical bilayered proteolipids, harboring various bioactive molecules. Due to the complexity of the vesicular nomenclatures and components, online searches for EV-related publications and vesicular components are currently challenging. Results: We present an improved version of EVpedia, a public database for EVs research. This community web portal contains a database of publications and vesicular components, identification of orthologous vesicular components, bioinformatic tools and a personalized function. EVpedia includes 6879 publications, 172 080 vesicular components from 263 high-throughput datasets, and has been accessed more tha…

Biomedical ResearchDatabases FactualComputer scienceBioactive moleculesMedizinBioinformaticsBiochemistryMathematical SciencesUser-Computer InterfaceNon-U.S. Gov'tdatabasecomputer.programming_languagePLASMAMICROPARTICLESResearch Support Non-U.S. Gov'tbioinformaticsBiological SciencesOriginal PapersCANCERComputer Science ApplicationsIdentification (information)Cell and molecular biologyComputational MathematicsComputational Theory and MathematicsPROTEOMIC ANALYSISMEMBRANE-VESICLESEXPRESSIONStatistics and ProbabilityPROSTASOMESJavaBioinformaticsexosomesResearch SupportExtracellular vesiclesWorld Wide WebDatabasesDELIVERYInformation and Computing SciencesJournal ArticleHumansMembrane vesicleMolecular BiologyFactualEXOSOMESComputational BiologyCELLSDatabase Management SystemsExtracellular SpacecomputerSoftware
researchProduct

Soft errors in commercial off-the-shelf static random access memories

2016

International audience; This article reviews state-of-the-art techniques for the evaluation of the effect of radiation on static random access memory (SRAM). We detailed irradiation test techniques and results from irradiation experiments with several types of particles. Two commercial SRAMs, in 90 and 65 nm technology nodes, were considered as case studies. Besides the basic static and dynamic test modes, advanced stimuli for the irradiation tests were introduced, as well as statistical post-processing techniques allowing for deeper analysis of the correlations between bit-flip cross-sections and design/architectural characteristics of the memory device. Further insight is provided on the …

ImaginationDynamic test modeComputer sciencemedia_common.quotation_subject01 natural sciencesParticle detector[SPI]Engineering Sciences [physics]0103 physical sciencesMaterials ChemistryElectronic engineeringStatic random-access memoryElectrical and Electronic EngineeringLayer (object-oriented design)Ionizing Particlesmedia_common010302 applied physics[PHYS]Physics [physics]010308 nuclear & particles physicsDetectorCondensed Matter PhysicsSRAMBit mappingElectronic Optical and Magnetic MaterialsStatic test modeMarch testParticle detectorCommercial off-the-shelfRandom accessDynamic testing
researchProduct