0000000000732787
AUTHOR
Stefan Hüfner
NanoESCA: imaging UPS and XPS with high energy resolution
Abstract A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term ( α 2 -term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 …
Quantitative microscopy of magnetic domains in Fe(100) by core-level x-ray photoelectron spectroscopy
We present an experimental technique for imaging of magnetic domain patterns based on element-specific core-level photoemission using polarized soft-x-ray radiation. It is applied to the measurement of domain patterns at the Fe(100) surface and at the surface of polycrystalline Fe. Different from well established imaging techniques that use a photoemission electron microscope to measure the secondary electron intensity at the Fe absorption threshold, we have investigated the photoemission intensity contrast on the the Fe $2{p}_{3∕2}$ core level using circularly polarized x-ray light. The linear and circular dichroism characteristics of the identical domain pattern are extracted by linear co…