6533b82efe1ef96bd1293ac9
RESEARCH PRODUCT
NanoESCA: imaging UPS and XPS with high energy resolution
Friedrich ReinertGerd SchönhenseStefan HüfnerHans-joachim ElmersM. MerkelP. BernhardD. FunnemannFrank FörsterS. SchmidtN. WeberM. EscherB. KrömkerCh. Ziethensubject
RadiationMicroscopeElectron spectrometerSpectrometerChemistryPhotoemission spectroscopyResolution (electron density)Analytical chemistryCondensed Matter PhysicsElectron spectroscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionX-ray photoelectron spectroscopylawPhysical and Theoretical ChemistrySpectroscopyUltraviolet photoelectron spectroscopydescription
Abstract A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term ( α 2 -term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 meV along with a high spatial resolution allows a detailed analysis of trace elements in the meteorite sample as well as local UPS spectra of the surface of the Cu sample.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-06-01 | Journal of Electron Spectroscopy and Related Phenomena |