0000000000027881

AUTHOR

M. Merkel

showing 39 related works from this author

High-statistics study of f0(1500) decay into π0π0

1995

Abstract A partial-wave analysis of the reaction p p →π 0 π 0 π 0 has been performed using a high-quality high-statistics data set of 712 000 events. In addition to the f0(975) and f0(1300), the scalar resonance with mass m = (1500 ± 15) MeV and width Γ = (120 ± 25) MeV is necessary to describe the data.

Data setPhysicsNuclear physicsNuclear and High Energy PhysicsParticle physicsAngular distributionPartial wave analysisScalar (mathematics)Dalitz plotResonance (particle physics)Physics Letters B
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Energy- and time-resolved microscopy using PEEM: recent developments and state-of-the-art

2008

Two novel methods of spectroscopic surface imaging are discussed, both based on photoemission electron microscopy PEEM. They are characterised by a simple electron-optical set up retaining a linear column. An imaging high-pass energy filter has been developed on the basis of lithographically-fabricated microgrids. Owing to a mesh size of only 7μm, no image distortions occur. The present energy resolution is 70 meV. The second approach employs time-of-flight energy dispersion and time-resolved detection using a Delayline Detector. In this case, the drift energy and the time resolution of the detector determine the energy resolution. The present time resolution is 180 ps, giving rise to an en…

PhysicsHistoryRange (particle radiation)business.industryResolution (electron density)DetectorAnalytical chemistryComputer Science ApplicationsEducationPhotoemission electron microscopyOpticsSecondary emissionMicroscopyEmission spectrumbusinessEnergy (signal processing)Journal of Physics: Conference Series
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The Crystal Barrel data acquisition system

1992

The main detector components of the Crystal Barrel (CBAR) experiment at the Low Energy Antiproton Ring (LEAR) at CERN are two proportional wire chambers, a jet drift chamber and an electromagnetic calorimeter composed of 1380 CsI(Tl) crystals, with a total of 4380 analog channels. A description is given of the use of distributed VME-based microcomputers to collect data from the various subdetectors and to merge the full event information in a global event builder. At this level the data are transferred to a mu VAX for tape storage and monitoring. >

PhysicsNuclear and High Energy PhysicsLarge Hadron ColliderMagnetic tape data storagePhysics::Instrumentation and DetectorsDetectorlaw.inventionNuclear physicsAnalog televisionData acquisitionNuclear Energy and EngineeringlawAntiprotonNuclear electronicsScintillation counterPhysics::Accelerator PhysicsHigh Energy Physics::ExperimentElectrical and Electronic EngineeringIEEE Transactions on Nuclear Science
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Study of annihilation at rest into ωηπ0

1994

Abstract We have studied p p annihilations at rest in liquid hydrogen into the final state ωηπ 0 where ω decays to π 0 γ . This reaction is dominated by the production of α 0 (980) and contributions from a 2 (1320) and b 1 0 (1235). Upper limits for the production of an axial vector h ′ 1 (1380) meson and vector mesons ω(1390), ω(1600), and φ(1680) decaying to ωη are given. The branching ratio of p p annihilation into ωηπ 0 was determined to be (0.68±0.01±0.05)%.

PhysicsNuclear physicsNuclear and High Energy PhysicsParticle decayAnnihilationMesonBranching fractionElementary particleState (functional analysis)Atomic physicsUpper and lower boundsPseudovectorPhysics Letters B
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Nanosession: Advanced Spectroscopy and Scattering

2013

OpticsMaterials sciencebusiness.industryScatteringAtomic physicsbusinessSpectroscopy
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The pseudoscalar mixing angle ΘPS from ν and ν′ production in annihiltion at rest

1992

Abstract We have determined ratios of branching ratios for p p annihilations at rest into π0η and π0η′, into ηη and ηη′, and into ωη and ωη′. All reactins are observed in two different all-neutral final states. The ratios permit a determination of the pseudoscalar mixing angle. We find ΘPS = −(17.3±1.8)°.

PhysicsPseudoscalarRest (physics)Nuclear and High Energy PhysicsParticle physicsBranching fractionMixing (physics)Physics Letters B
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Time-of-flight photoelectron emission microscopy TOF-PEEM: first results

1998

The time structure of the synchrotron radiation at BESSY (Berlin) is used to operate a photoemission electron microscope in a time-of-flight (TOF) mode. The electrons which are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. The screen of the microscope was replaced by a fast scintillator (tau = 1.4 ns) and the light is detected by an ultra fast gated intensified CCD camera (800 ps gate 1 MHz repetition rate). The resolving power in the energy domain is demonstrated and possible implications on the spatial resolution (chromatic correction) are discussed. Additionally, an improved contrast at very low emission energies i…

PhysicsNuclear and High Energy PhysicsMicroscopebusiness.industryPhysics::Instrumentation and DetectorsSynchrotron radiationElectronScintillatorlaw.inventionTime of flightOpticslawChromatic scaleElectron microscopebusinessInstrumentationImage resolution
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New states as observed by the Crystal Barrel experiment

1993

Abstract The Crystal Barrel Detector has been in operation since October 1989. Results on the analysis of the annihilation of protonium at rest into three pseudoscalars is presented. The π 0 π 0 π 0 final state confirms the existence of ƒ 2 (1520)→π 0 π 0 . In the ηη system of the π 0 ηη final state an isoscalar J PC = 0 ++ resonance with a mass of 1560 MeV/c 2 and a width of 245 MeV/c 2 is observed. The identification with ƒ 0 (1590) is doubtful since the ηη' decay is not observed with the corresponding strength. Our analysis yields an upper limit for the relative branching ratio BR(ƒ 0 (1560)→ηη') BR(ƒ 0 (1560)→ηη) .

Nuclear physicsCrystalPhysicsNuclear and High Energy PhysicsBarrelAnnihilationProtoniumBranching fractionIsoscalarResonanceState (functional analysis)Atomic physicsNuclear Physics A
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Test of chiral perturbation theory in η decays

1994

The decay of the η-meson into three pions plays an important role as a test of low-energy QCD calculations in the framework of chiral perturbation theory. Previous experiments show results that are inconclusive or even contradictory. The Crystal Barrel experiment at LEAR has determined the braching ratiosΓ(η→3π0)/Γ(η→π+π−π0)=1.47±0.09±0.15 andΓ(η→γγ)/Γ(η→π+π−π0)=1.88±0.10±0.17 using its unique features to detect charged particles as well as neutral particles. The value for the first ratio agrees nicely with the theoretical predictions and solves previous experimental uncertainties. The second value, which yields a partial width ofΓ(η→π+π−π0)=(0.24±0.03) keV, shows that the same next-to-lead…

Quantum chromodynamicsCrystalNuclear physicsPhysicsParticle physicsChiral perturbation theoryPionPartial widthOrder (group theory)Charged particleIl Nuovo Cimento A
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Nanoelectron spectroscopy for chemical analysis: a novel energy filter for imaging x-ray photoemission spectroscopy

2005

An ovel instrument for imaging ESCA is described. It is based on a tandem arrangement of two hemispherical energy analysers used as an imaging energy filter. The main spherical aberration (α 2 -term) of the analyser is corrected by the antisymmetry of the tandem configuration. The kinetic energy range useable for imaging extends up to 1.6 keV; this is compatible with Mg and Al Kα laboratory x-ray sources. First experiments on the chemical surface composition of a Cu0.98Bi0.02 polycrystal, a GaAs/AlGaAs heterostructure and Ag crystallites on Si(111) have been performed using synchrotron radiation. The results reveal an energy resolutio no f190 meV and a lateral resolution (edge resolution) o…

Chemistrybusiness.industryAnalyserBremsstrahlungAnalytical chemistrySynchrotron radiationCondensed Matter PhysicsKinetic energyElectron spectroscopySpherical aberrationOpticsX-ray photoelectron spectroscopyGeneral Materials ScienceSpectroscopybusinessJournal of Physics: Condensed Matter
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The Crystal Barrel spectrometer at LEAR

1992

The crystal Barrel spectrometer used at LEAR, CERN to study the products of pd annihilations is described. A 1380 element array of Csl crystals measures photons from the decay of π0, η, η′ and ω mesons. A segmented drift chamber in a 1.5T magnetic field is used to identify and measure charged particles. A fast on-line trigger on charged and neutral multiplicities and on the invariant mass of secondary particles is available. The performance of the detector is discussed.

PhysicsNuclear and High Energy PhysicsPhotonLarge Hadron ColliderSpectrometerMesonPhysics::Instrumentation and Detectors010308 nuclear & particles physics01 natural sciencesCharged particleMagnetic fieldNuclear physicsCrystal0103 physical sciencesInvariant mass[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]Detectors and Experimental Techniques010306 general physicsInstrumentation
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Inspection of EUVL mask blank defects and patterned masks using EUV photoemission electron microscopy

2008

We report on recent developments of an "at-wavelength" full-field imaging technique for inspection of multilayer mask blank defects and patterned mask samples for extreme ultraviolet lithography (EUVL) by EUV photoemission electron microscopy (EUV-PEEM). A bump-type line defect with a width of approximately 35nm that is buried beneath Mo/Si multilayer has been detected clearly, and first inspection results obtained from a patterned TaN absorber EUVL mask sample is reported. Different image contrast of a similar width of multilayer-covered substrate line defect and on top TaN absorber square has been observed in the EUV-PEEM images, and origin of the difference in their EUV-PEEM image contra…

Materials sciencebusiness.industryExtreme ultraviolet lithographySubstrate (electronics)Condensed Matter PhysicsBlankAtomic and Molecular Physics and OpticsImage contrastSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopyOpticslawOptoelectronicsElectrical and Electronic EngineeringPhotolithographyElectron microscopebusinessLine (formation)Microelectronic Engineering
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A new approach for actinic defect inspection of EUVL multilayer mask blanks: Standing wave photoemission electron microscopy

2006

Extreme ultraviolet lithography (EUVL) at 13.5 nm is the next generation lithography technique capable of printing sub-50 nm structures. With decreasing feature sizes to be printed, the requirements for the lithography mask also become more stringent in terms of defect sizes and densities that are still acceptable and the development of lithography optics has to go along with the development of new mask defect inspection techniques that are fast and offer high resolution (preferable in the range of the minimum feature size) at the same time. We report on the development and experimental results of a new 'at wavelength' full-field imaging technique for defect inspection of multilayer mask bl…

Materials sciencephotoemission electronbusiness.industryExtreme ultraviolet lithographyCondensed Matter Physicsmultilayer mask blankAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopyWavelengthOpticslawEUV lithographymicroscopyOptoelectronicsX-ray lithographyElectrical and Electronic EngineeringPhotolithographyactinic defect inspectionbusinessLithographyImage resolutionNext-generation lithographyMicroelectronic Engineering
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Antiproton-proton annihilation in-flight

1994

This is an overview of the preliminary results of\(\bar pp\) annihilation at incident\(\bar p\) momenta of 600, 1200 and 1940 MeV/c(*). The data was taken at LEAR with the Crystal Barrel Detector (E. Akeret al.:Nucl. Instrum. Methods A,321, 108 (1992)). In the two pseudoscalar final states seven different channels are observable and their angular distributions are measured. They are compared to older data, if existent, and are found to be equal within the experimental errors. In the three-meson final states, an overview of the already examined final states is given. Striking signals in the Dalitz plots and invariant-mass projections for a set of final states are observed. In the final state…

PhysicsParticle physicsAnnihilationProton010308 nuclear & particles physics[PHYS.NEXP] Physics [physics]/Nuclear Experiment [nucl-ex]Nuclear TheoryDalitz plotObservable[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]01 natural sciencesPseudoscalarNuclear physicsAntiproton0103 physical sciencesInvariant massNuclear Experiment010306 general physicsBar (unit)
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Proton-antiproton annihilation into ηηπ-observation of a scalar resonance decaying into ηη

1992

Abstract The results of a measurement of pp annihilation at rest into ηηπ 0 are presented. Assuming a resonance dominated model for the annihilation process an isoscalar J PC =0 ++ resonance decaying into ηη is observed with a mass of 1560±25 MeV/ c 2 and a width of 245±50 MeV/ c 2 .

PhysicsNuclear and High Energy PhysicsParticle physicsAnnihilationProton010308 nuclear & particles physicsIsoscalarNuclear TheoryScalar (mathematics)Dalitz plot01 natural sciencesResonance (particle physics)Nuclear physicsAntiproton0103 physical sciencesMass spectrum010306 general physicsPhysics Letters B
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Antiproton annihilation at rest in liquid deuterium into π−π0π0pS

1994

With the Crystal Barrel detector, the final state π−π0π0pS at rest in liquid deuterium was measured for the first time. A preliminary partial-wave analysis was performed, which required two interesting features: besides the ρ(770), a second pole was needed in the ππP-wave and a narrow resonance in the ππS-wave, slightly above 1500 MeV/c2. With the same parametrization a high-statistics π+π−π0 data set could also be well described.

Nuclear physicsPhysicsCrystalAnnihilationDeuteriumAntiprotonPartial wave analysisResonanceDalitz plotAtomic physicsParametrizationIl Nuovo Cimento A Series 11
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Circular dichroism in angular resolved photoemission from pure and Rb-doped C60 and C22H14 layers on platinum and tungsten

1997

Abstract Polycrystalline C60 and Pentacene films grown on W(110) and Pt(111) have been studied in valence band photoemission using circularly polarised synchrotron radiation from BESSY with special emphasis on circular dichroism in photoemission. For thin films of C60, dichroic asymmetries of about 10% occur independent of the temperature and the substrate hinting that the rotation of the topmost layer is hindered even at room temperature. For Pentacene we found asymmetries up to 50% in the region of the σ-electrons. Moreover, we found for this molecule a dichroic asymmetry in normal emission, that is a forbidden geometry. This hints on adsorption with the molecules perpendicularly oriented…

Circular dichroismValence (chemistry)Binding energyInverse photoemission spectroscopyMetals and Alloyschemistry.chemical_elementSurfaces and InterfacesElectronic structureDichroismSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsRubidiumPentacenechemistry.chemical_compoundchemistryMaterials ChemistryAtomic physicsThin Solid Films
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Actinic inspection of sub-50 nm EUV mask blank defects

2007

A new actinic mask inspection technology to probe nano-scaled defects buried underneath a Mo/Si multilayer reflection coating of an Extreme Ultraviolet Lithography mask blank has been implemented using EUV Photoemission Electron Microscopy (EUV-PEEM). EUV PEEM images of programmed defect structures of various lateral and vertical sizes recorded at around 13 nm wavelength show that 35 nm wide and 4 nm high buried line defects are clearly detectable. The imaging technique proves to be sensitive to small phase jumps enhancing the visibility of the edges of the phase defects which is explained in terms of a standing wave enhanced image contrast at resonant EUV illumination.

Materials sciencebusiness.industryExtreme ultraviolet lithographyMask inspectionlaw.inventionStanding wavePhotoemission electron microscopyWavelengthOpticslawExtreme ultravioletOptoelectronicsPhotolithographyPhotomaskbusiness23rd European Mask and Lithography Conference
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NanoESCA: imaging UPS and XPS with high energy resolution

2005

Abstract A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term ( α 2 -term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 …

RadiationMicroscopeElectron spectrometerSpectrometerChemistryPhotoemission spectroscopyResolution (electron density)Analytical chemistryCondensed Matter PhysicsElectron spectroscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionX-ray photoelectron spectroscopylawPhysical and Theoretical ChemistrySpectroscopyUltraviolet photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Quantitative microscopy of magnetic domains in Fe(100) by core-level x-ray photoelectron spectroscopy

2005

We present an experimental technique for imaging of magnetic domain patterns based on element-specific core-level photoemission using polarized soft-x-ray radiation. It is applied to the measurement of domain patterns at the Fe(100) surface and at the surface of polycrystalline Fe. Different from well established imaging techniques that use a photoemission electron microscope to measure the secondary electron intensity at the Fe absorption threshold, we have investigated the photoemission intensity contrast on the the Fe $2{p}_{3∕2}$ core level using circularly polarized x-ray light. The linear and circular dichroism characteristics of the identical domain pattern are extracted by linear co…

Circular dichroismMagnetizationNuclear magnetic resonanceMaterials scienceX-ray photoelectron spectroscopyMagnetic domainInverse photoemission spectroscopyAngle-resolved photoemission spectroscopyCondensed Matter PhysicsMolecular physicsSecondary electronsCircular polarizationElectronic Optical and Magnetic MaterialsPhysical Review B
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New results from crystal barrel

1993

Results are presented on meson spectroscopy, two-body final states and meson decay modes observed in\(\bar pp\) annhilation at rest by the Crystal Barrel experiment at LEAR.

PhysicsParticle physicsMeson[PHYS.HEXP] Physics [physics]/High Energy Physics - Experiment [hep-ex]010308 nuclear & particles physicsHigh Energy Physics::LatticeNuclear TheoryHigh Energy Physics::PhenomenologyBarrel (horology)Dalitz plot01 natural sciences3. Good healthCrystalNuclear physicsHadron spectroscopy0103 physical sciences[PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex]High Energy Physics::ExperimentNuclear Experiment010306 general physicsSpectroscopyBar (unit)
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High statistics study of ƒ0(1500)s decay into ηη

1995

Abstract A partial wave analysis of the reaction p p →π o ηη has been performed, using a high quality, high statistics data set of 198,000 events. In addition to the ƒ 0 (1370), a second scalar resonance decaying into ηη, the ƒ 0 (1500), with mass m = (1505 ± 15) MeV and width Γ = (120 ± 30) MeV has to be introduced to describe the data.

Nuclear physicsPhysicsNuclear and High Energy PhysicsParticle physicsQuality (physics)Partial wave analysisScalar (mathematics)StatisticsDalitz plotResonancePhysics Letters B
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High-statistics analysis of $$\bar pp \to \pi ^0 \pi ^0 \pi ^0 $$ at restat rest

1994

Antiproton-proton annihilation at rest into 3π0 is analysed based on a data sample of about 500 000 high-quality 3π0 events. In this high-statistics Dalitz plot two structures in the region of π0π0 invariant masses of about 1500 MeV show up, a small band and a blob at higher masses. In a first attempt to describe the data two different models are used to parametrize the dynamical amplitudes leading to the same conclusion: the data require a 0+ + and also a 2+ + resonance in the 1500 MeV region.

Nuclear physicsRest (physics)PhysicsParticle physicsAnnihilationAmplitudePiDalitz plotInvariant (mathematics)Nuclear ExperimentResonance (particle physics)Bar (unit)Il Nuovo Cimento A Series 11
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At-wavelength inspection of sub-40 nm defects in extreme ultraviolet lithography mask blank by photoemission electron microscopy.

2007

A new at-wavelength inspection technology to probe nanoscale defects buried underneath Mo/Si multilayers on an extreme ultraviolet (EUV) lithography mask blank has been implemented using EUV photoemission electron microscopy (EUV-PEEM). EUV-PEEM images of programmed defect structures of various lateral and vertical sizes recorded at an ~13.5 nm wavelength show that 35 nm wide and 4 nm high buried line defects are clearly detectable. The imaging technique proves to be sensitive to small phase jumps, enhancing the edge visibility of the phase defects, which is explained in terms of a standing wave enhanced image contrast at resonant EUV illumination.

Materials sciencebusiness.industryExtreme ultraviolet lithographyAtomic and Molecular Physics and Opticslaw.inventionPhotoemission electron microscopyWavelengthOpticslawExtreme ultravioletMicroscopyOptoelectronicsPhotolithographybusinessLithographyElectron-beam lithographyOptics letters
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Actinic EUVL mask blank defect inspection by EUV photoelectron microscopy

2006

A new method for the actinic at-wavelength inspection of defects inside and ontop of Extreme Ultraviolet Lithography (EUVL) multilayer-coated mask blanks is presented. The experimental technique is based on PhotoElectron Emission Microscopy (PEEM) supported by the generation of a standing wave field inside and above the multilayer mask blank when illuminated near the resonance Bragg wavelength at around 13.5 nm wavelength. Experimental results on programmed defect samples based on e-beam lithographic structures or PSL equivalent silica balls overcoated with an EUV multilayer show that buried defects scaling down to 50 nm in lateral size are detectable with further scalability down to 30 nm …

Materials sciencebusiness.industryExtreme ultraviolet lithographyBlanklaw.inventionStanding waveWavelengthOpticslawExtreme ultravioletMicroscopyOptoelectronicsPhotolithographybusinessLithographySPIE Proceedings
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First observation of the production of nucleon resonances in antiproton annihilation in liquid deuterium

1995

Nuclear physicsPhysicsNuclear and High Energy PhysicsParticle physicsAnnihilationDeuteriumAntiprotonNucleonParticle Physics - ExperimentPhysics Letters B
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Phase defect inspection of multilayer masks for 13.5 nm optical lithography using PEEM in a standing wave mode

2007

We report on recent developments of an "at wavelength" full-field imaging technique for defect inspection of multilayer mask blanks for extreme ultraviolet lithography (EUVL). Our approach uses photoemission electron microscopy (PEEM) in a near normal incidence mode at 13.5 nut wavelength to image the photoemission induced by the EUV wave field on the multilayer blank surface. We analyze buried defects on Mo/Si multilayer samples down to a lateral size of 50 nm and report on first, results obtained from a six inches mask blank prototype as prerequisite for industrial usage. (c) 2007 Elsevier B.V. All rights reserved.

Materials sciencebusiness.industryphotoemission electronExtreme ultraviolet lithographydefect analysisPhase (waves)Surfaces and InterfacesCondensed Matter PhysicsBlankSurfaces Coatings and Filmslaw.inventionStanding waveextreme ultraviolet lithography (EUVL)WavelengthPhotoemission electron microscopyOpticslawmultilayer mask blanksMaterials ChemistryOptoelectronicsEUV-PEEMPhotolithographybusinessLithographymicroscopy (PEEM)
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Partial-wave analysis of ππη in $$\bar pp$$ annihilation at restannihilation at rest

1994

A new isovector scalar πη resonance with a mass of 1450 MeV is observed in a high-statistics study of\(\bar pp\) annihilation at rest into π0π0η.

Nuclear physicsPhysicsRest (physics)Particle physicsAnnihilationIsovectorPartial wave analysisNuclear TheoryScalar (mathematics)ResonanceBar (unit)Il Nuovo Cimento A Series 11
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P- versus S-wave at rest in LH2

1992

Abstract The annihilation p p →π 0 π 0 was measured for antiprotons stopped in liquid hydrogen (LH2). This reaction is only allowed from odd angular momentum states of the p p - atom . The resulting branching ratio BR ( p p →π 0 π 0 ) LH 2 =(6.93±0.22 stat ±0.37 syst )×10 −4 , combined with a previous measurement of the branching ratio BR ( p p →π + π − ) 2 P in gas from the 2P-state of p p suggests a fraction of P-wave annihilation in LH2 of (28.8±3.5)%, much larger than the values obtained from other annihilation channels. A method of reconciling the contradictory results is discussed.

PhysicsNuclear and High Energy PhysicsAngular momentumAnnihilationAntiprotonBranching fractionS-waveAtomAtomic physicsPhysics Letters B
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Fast elemental mapping and magnetic imaging with high lateral resolution using a novel photoemission microscope

1998

Abstract Using tunable soft X-ray synchrotron radiation and a new-generation photoemission electron microscope with integral sample stage and microarea selector, elemental images and local XANES spectra have been measured. Given the present conditions (PM3 at BESSY), the lateral resolution was in the range of 130 nm with the potential of considerable improvement with high-brilliance sources (a base resolution of 25 nm was obtained in threshold photoemission). Measurements at the oxygen K-edge demonstrate that differences in the local chemical environment of the emitter atom are clearly revealed and can thus be used as a fingerprint technique for its chemical state and geometrical surroundin…

RadiationMicroscopeMagnetic domainbusiness.industryMagnetic circular dichroismChemistryResolution (electron density)Analytical chemistrySynchrotron radiationAngle-resolved photoemission spectroscopyCondensed Matter PhysicsAtomic and Molecular Physics and OpticsXANESElectronic Optical and Magnetic Materialslaw.inventionOpticslawPhysical and Theoretical ChemistryElectron microscopebusinessSpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Antiproton-proton annihilation at rest into two mesons

1993

Abstract Branching ratios for antiproton-proton annihilations at rest into two mesons are given. The data were obtained at LEAR by stopping antiprotons in a liquid hydrogen target. Both charged and neutral annihilation products were detected in the Crystal Barrel detector. Representative data are presented, and their bearing on the general picture of annihilation dynamics is discussed. In addition, preliminary branching ratios for two-body radiative annihilations are given.

Nuclear physicsPhysicsNuclear and High Energy PhysicsParticle physicsAnnihilationMesonAntiprotonRadiative transferHigh Energy Physics::ExperimentNuclear ExperimentLiquid hydrogenNuclear Physics A
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Hidden and open $$\bar ss$$ production in $$\bar pp$$ annihilation at restannihilation at rest

1994

New branching ratios for\(\bar pp\) annihilation at rest into final states with a\(K\bar K\) pair or φ-meson are being measured with the Crystal Barrel detector at LEAR. The yield of φγ, relative to ωγ, appears to violate the OZI rule as strongly as φπ relative to ωπ.

Nuclear physicsPhysicsParticle physicsAnnihilationOZI ruleHigh Energy Physics::PhenomenologyDalitz plotHigh Energy Physics::ExperimentIl Nuovo Cimento A Series 11
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Three-dimensional characterization of extreme ultraviolet mask blank defects by interference contrast photoemission electron microscopy

2008

A photoemission electron microscope based on a new contrast mechanism "interference contrast" is applied to characterize extreme ultraviolet lithography mask blank defects. Inspection results show that positioning of interference destructive condition (node of standing wave field) on surface of multilayer in the local region of a phase defect is necessary to obtain best visibility of the defect on mask blank. A comparative experiment reveals superiority of the interference contrast photoemission electron microscope (Extreme UV illumination) over a topographic contrast one (UV illumination with Hg discharge lamp) in detecting extreme ultraviolet mask blank phase defects. A depth-resolved det…

Optics and PhotonicsMaterials scienceLightUltraviolet Raysbusiness.industryMicroscopy UltravioletExtreme ultraviolet lithographyEquipment DesignBlankDark field microscopyAtomic and Molecular Physics and Opticslaw.inventionMicroscopy ElectronPhotoemission electron microscopyWavelengthOpticslawExtreme ultravioletMicroscopyOptoelectronicsMicroscopy InterferencePhotolithographybusinessOptics Express
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Final states with strangeness from Crystal Barrel and Asterix

1993

Abstract We discuss φ production in p p annihilation at rest from the Asterix and Crystal Barrel experiments and compare the branching ratios to similar final states without strangeness. The ωπ 0 φπ 0 production ratio is unexpectedly low. In the search for new states, the φπ0 mass spectrum shows no evidence for a resonance in the 1450 MeV/c2 mass range but the K☆K0π0 Dalitz plot shows interesting structure.

PhysicsNuclear physicsNuclear and High Energy PhysicsParticle physicsAnnihilationMass spectrumDalitz plotASTERIXStrangenessNuclear Physics A
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Trace element analysis in pre-solar stardust grains via full-field imaging XPS (Nano-ESCA)

2006

An acid-resistant, SiC-rich, residue from the Murchison meteorite was investigated by means of a novel imaging XPS instrument. The micrometer-sized grains were deposited on a Si wafer from an aqueous suspension. Energy filtered ESCA images have been taken in the kinetic energy range from the threshold up to about 400 eV for various photon energies. A lateral resolution of the order of 120 nm along with a high energy resolution in the range of 100 meV provides the basis for chemical trace element analysis with maximum sensitivity. Apart from major (Si, C) and minor (N, Mg, Al, Fe) elements, the energy filtered images and local microspectra revealed the presence of a variety of heavy trace el…

Murchison meteoriteNuclear and High Energy PhysicsMaterials scienceTrace AmountsX-ray photoelectron spectroscopyAnalytical chemistryNatural abundanceSpectroscopyKinetic energyInstrumentationMicroanalysisElectron spectroscopyNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

2001

The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 μm using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented.

business.industryChemistryAnalyserSynchrotron radiationSurfaces and InterfacesCondensed Matter PhysicsSynchrotronSurfaces Coatings and Filmslaw.inventionPhotoemission electron microscopyOpticsX-ray photoelectron spectroscopyFilter (video)lawMaterials ChemistryElectron microscopebusinessExcitationSurface Science
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Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory

2000

Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.

Conventional transmission electron microscopeHistologyMicroscopebusiness.industryScanning electron microscopeChemistryMolecular physicsCathodePathology and Forensic Medicinelaw.inventionOpticslawScanning transmission electron microscopyWork functionsense organsElectron microscopeElectron beam-induced depositionbusinessJournal of microscopy
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Search for a new light gauge boson in decays of π0 and η

1994

Abstract We have searched for new light gauge bosons produced in π 0 and η decays by studying the kinematically well-constrained reactions p p→π 0 π 0 π 0 and p p→π 0 π 0 η , where one π 0 or the η decays through the emission of a single photon recoiling against a missing state X (where X is a long-lived weakly interacting particle or X →ν ν ). No signal has been observed and branching ratio upper limits of 6 × 10 −5 at 90% C.L. have been obtained for masses of the gauge boson lying between ∼65 MeV and 125 MeV ( π 0 decay), and 6 × 10 −5 at 90% C.L. for X masses between ∼200 MeV and 525 MeV (η decay). The π 0 -decay limit represents a factor of 4 to 8 improvement when compared to the existi…

PhysicsNuclear and High Energy PhysicsRange (particle radiation)Gauge bosonParticle physicsPhoton[PHYS.HEXP] Physics [physics]/High Energy Physics - Experiment [hep-ex]010308 nuclear & particles physicsBranching fractionElementary particle01 natural sciencesUpper and lower boundsNuclear physicsParticle decayPhoton emission0103 physical sciences[PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex]010306 general physicsParticle Physics - ExperimentPhysics Letters B
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First observations of Pontecorvo reactions with a recoiling neutron

1995

We report the first observations of Pontecorvo reactions of the type ¯pd →Xn. We fully reconstruct the outgoing meson and, for antiprotons stopped in liquid deuterium, we measure: BR(¯pd→π0)=(7.03±0.72)×10−6, BR(¯pd→ηn)=(3.19+0.48)×10−6, BR(¯pd→ωn)=(22.8+4.1)×10−6, BR(¯pd→η′n)14×10−6 (at 95% confidence level). Assuming charge independence, our result for¯ pd→π0n is compatible with measurements of the only other observed Pontecorvo reaction ¯pd → π−p. The experimental ratios between the above branching ratios are in fair agreement with both the statistical model and dynamical two-step models (assumingN¯ N annihilation into two mesons, with subsequent absorption of one meson on the remaining …

PhysicsNuclear physicsNuclear and High Energy PhysicsParticle physicsAnnihilationDeuteriumMesonAntiprotonNuclear fusionNeutronNucleonZeitschrift für Physik A Hadrons and Nuclei
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