6533b7dafe1ef96bd126df9b
RESEARCH PRODUCT
Nanoelectron spectroscopy for chemical analysis: a novel energy filter for imaging x-ray photoemission spectroscopy
P. BernhardD. FunnemannC ZiethenNils WeberF. ForsterGerd SchönhenseB. KrömkerS. SchmidtM. MerkelF. ReinertM. Eschersubject
Chemistrybusiness.industryAnalyserBremsstrahlungAnalytical chemistrySynchrotron radiationCondensed Matter PhysicsKinetic energyElectron spectroscopySpherical aberrationOpticsX-ray photoelectron spectroscopyGeneral Materials ScienceSpectroscopybusinessdescription
An ovel instrument for imaging ESCA is described. It is based on a tandem arrangement of two hemispherical energy analysers used as an imaging energy filter. The main spherical aberration (α 2 -term) of the analyser is corrected by the antisymmetry of the tandem configuration. The kinetic energy range useable for imaging extends up to 1.6 keV; this is compatible with Mg and Al Kα laboratory x-ray sources. First experiments on the chemical surface composition of a Cu0.98Bi0.02 polycrystal, a GaAs/AlGaAs heterostructure and Ag crystallites on Si(111) have been performed using synchrotron radiation. The results reveal an energy resolutio no f190 meV and a lateral resolution (edge resolution) of 120 nm. Besides elimination of the analyser’s spherical aberration, the tandem arrangement largely retains the time structure of the electron signal, unlike a singl eh emispherical analyser.
year | journal | country | edition | language |
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2005-04-08 | Journal of Physics: Condensed Matter |