6533b862fe1ef96bd12c6196
RESEARCH PRODUCT
Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter
M. KlaisM. EscherCh. ZiethenJ SettemeyerD. FunnemannOliver G. SchmidtGerd SchönhenseM. MerkelAndreas Oelsnersubject
business.industryChemistryAnalyserSynchrotron radiationSurfaces and InterfacesCondensed Matter PhysicsSynchrotronSurfaces Coatings and Filmslaw.inventionPhotoemission electron microscopyOpticsX-ray photoelectron spectroscopyFilter (video)lawMaterials ChemistryElectron microscopebusinessExcitationdescription
The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 μm using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-06-01 | Surface Science |