0000000001156433

AUTHOR

M. Klais

showing 2 related works from this author

Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

2001

The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 μm using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented.

business.industryChemistryAnalyserSynchrotron radiationSurfaces and InterfacesCondensed Matter PhysicsSynchrotronSurfaces Coatings and Filmslaw.inventionPhotoemission electron microscopyOpticsX-ray photoelectron spectroscopyFilter (video)lawMaterials ChemistryElectron microscopebusinessExcitationSurface Science
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Size dependence of magnetic domain patterns in exchange-biased Permalloy/NiO microstructures

2002

The magnetic domain structure in Permalloy (Ni81Fe19) micropatterns (10?100??m) on NiO has been investigated by means of soft x-ray photoemission electron microscopy. The exchange anisotropy between the Ni81Fe19 patterns and the NiO layer results in the formation of complex domain structures which markedly differ from the simple Landau?Lifshitz configurations. The domain structures reflect the competition between the exchange anisotropy and the dipole?dipole interaction in a weakly coupled system. The observed domain structures change with the feature size, as the domain patterns lose complexity in the smaller structures.

PermalloySURFACEAcoustics and UltrasonicsMagnetic domainCondensed matter physicsChemistrySpin valveMICROSCOPYCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsMagnetic anisotropyDipoleExchange biasSPECTROMICROSCOPYNIO(100)AnisotropyMagnetic dipoleJournal of Physics D: Applied Physics
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