0000000000780436

AUTHOR

Stefan Kuhn

showing 2 related works from this author

Deposition order controls the first stages of a metal-organic coordination network on an insulator surface

2016

| openaire: EC/FP7/610446/EU//PAMS We report on first stages toward the formation of a surface-confined metal-organic coordination network (MOCN) by sequential deposition of biphenyl-4,4′-dicarboxylic acid and iron atoms on the surface of a bulk insulator, calcite (10.4). The influence of the deposition order on the structure formation is studied by noncontact atomic force microscopy operated in ultrahigh vacuum at room temperature. It is found that sequential deposition facilitates MOCN formation when the organic linker molecules are first adsorbed on the surface, followed by iron deposition. This observation is explained by first-principles computations, indicating that the metal-molecule…

CalciteStructure formationta114Atomic force microscopyIron deposition02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology53001 natural sciences0104 chemical sciencesSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographychemistry.chemical_compoundGeneral EnergyAdsorptionchemistryChemical physicsLattice (order)Coordination networkMoleculePhysical and Theoretical Chemistry0210 nano-technologyJournal of Physical Chemistry C
researchProduct

Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy

2014

Noncontact atomic force microscopy (NC-AFM) features the measurement of forces with highest spatial resolution and sensitivity, resolving forces of the order of pico-Newtons with submolecular resolution. However, the measured total force is a mixture composed of various interactions. While some interactions such as electrostatic or magnetic forces can be excluded by a careful design of the experiment, the subtraction of van der Waals forces, which mainly originate from London dispersion interactions between the macroscopic tip shank and the bulk sample, remains a challenge. We present the determination of the inherently present van der Waals forces in total interaction force data from fitti…

PhysicsRange (particle radiation)Interaction forcesAtomic force microscopyResolution (electron density)Condensed Matter PhysicsLondon dispersion forceMolecular physicsElectronic Optical and Magnetic Materialssymbols.namesakeTransition pointsymbolsvan der Waals forceImage resolutionPhysical Review B
researchProduct