0000000000863231
AUTHOR
S. E. De Graaf
Quantitative infrared near-field imaging of suspended topological insulator nanostructures
The development of nanoscale solid-state devices exploiting the promising topological surface states of topological insulator materials requires careful device engineering and improved materials quality. For instance, the introduction of a substrate, device contact or the formation of oxide layers can cause unintentional doping of the material, spoiling the sought-after properties. In support of this, nanoscale imaging tools can provide useful materials information without the need for complex device fabrication. Here we study Bi$_2$Se$_3$ nanoribbons suspended across multiple material stacks of SiO$_2$ and Au using infrared scattering scanning near-field optical microscopy. We validate our…
Direct Identification of Dilute Surface Spins on Al2O3 : Origin of Flux Noise in Quantum Circuits
An on-chip electron spin resonance technique is applied to reveal the nature and origin of surface spins on Al2O3. We measure a spin density of 2.2×1017 spins/m2, attributed to physisorbed atomic hydrogen and S=1/2 electron spin states on the surface. This is direct evidence for the nature of spins responsible for flux noise in quantum circuits, which has been an issue of interest for several decades. Our findings open up a new approach to the identification and controlled reduction of paramagnetic sources of noise and decoherence in superconducting quantum devices.