0000000000878736

AUTHOR

Cesar Boatella Polo

showing 4 related works from this author

Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs

2018

In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy electron linac. For electron irradiations, the medical linacs are most commonly used due to their availability and flexibility. Whereas previous efforts were made to characterize the cross sections at higher energies, where the nuclear interaction cross section is higher, the focus of this paper is on the complete overview of relevant electron energies. Irradiations at an electron linac were made with two different devices, with a large difference in feature size. The irradiations at an experimental linac were performed with varying en…

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceta114010308 nuclear & particles physicselectronsElectron linacElectronhiukkaskiihdyttimetelektronitparticle accelerators01 natural sciencesLinear particle acceleratorNuclear physicsNuclear interactionradiation physicsCross section (physics)säteilyfysiikkaNuclear Energy and Engineering0103 physical sciencesElectrical and Electronic EngineeringEvent (particle physics)IEEE Transactions on Nuclear Science
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Mechanisms of Electron-Induced Single-Event Latchup

2019

In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this context. The cross section enhancement effect in the presence of high-Z materials is discussed. First experimental results of electron-induced latchups are shown in static random access memory devices with low linear energy transfer thresholds. The radiation hardness assurance implications and future work are discussed.

Nuclear and High Energy PhysicsWork (thermodynamics)Materials scienceSiliconchemistry.chemical_elementLinear energy transferContext (language use)Electronhiukkaskiihdyttimetelektronit01 natural sciencesradiation physics0103 physical sciencesElectronicsStatic random-access memoryDetectors and Experimental TechniquesElectrical and Electronic EngineeringRadiation hardeningta114010308 nuclear & particles physicsbusiness.industryelectronsparticle acceleratorssäteilyfysiikkaNuclear Energy and EngineeringchemistryOptoelectronicsbusinessIEEE Transactions on Nuclear Science
researchProduct

Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs

2018

In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy electron linac. For electron irradiations, the medical linacs are most commonly used due to their availability and flexibility. Whereas previous efforts were made to characterize the cross sections at higher energies, where the nuclear interaction cross section is higher, the focus of this paper is on the complete overview of relevant electron energies. Irradiations at an electron linac were made with two different devices, with a large difference in feature size. The irradiations at an experimental linac were performed with varying en…

radiation physicssäteilyfysiikkaelectronshiukkaskiihdyttimetelektronitparticle accelerators
researchProduct

Mechanisms of Electron-Induced Single Event Latchup

2019

In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this context. The cross section enhancement effect in the presence of high-Z materials is discussed. First experimental results of electron-induced latchups are shown in static random access memory devices with low linear energy transfer thresholds. The radiation hardness assurance implications and future work are discussed. peerReviewed

radiation physicssäteilyfysiikkaelectronshiukkaskiihdyttimetelektronitparticle accelerators
researchProduct