Nanoscale mechanical characterization of polymers by atomic force microscopy (AFM) nanoindentations: viscoelastic characterization of a model material

2009

The atomic force microscope (AFM), apart from its conventional use as a microscope, is also used for the characterization of the local mechanical properties of polymers. In fact, the elastic characterization of purely elastic materials using this instrument can be considered as a well-assessed technique while the characterization of the viscoelastic mechanical properties remains the challenge. In particular, one finds the mechanical behavior changing when performing indentations at different loading rates, i.e. on different time scales. Moreover, this apparent viscoelastic behavior can also be due to complex contact mechanics phenomena, with the onset of plasticity and long-term viscoelasti…