Pressure-induced phase transformations in mineral chalcocite, Cu2S, under hydrostatic conditions

Abstract High-pressure room-temperature angle-dispersive powder X-ray diffraction measurements on Cu2S chalcocite were performed up to 30 GPa using a diamond-anvil cell, He as pressure transmitting medium and synchrotron radiation. Two first-order phase transitions were found at 3.2 and 7.4 GPa. The indexation of the powder diffraction patterns suggests three different monoclinic cells for the low-pressure chalcocite and the two high-pressure phases. Subtle changes in the X-ray diffraction patterns suggest a third pressure-induced transition above 26 GPa. Structural parameters and compressibility are discussed and compared to those reported in a previous study on Cu2S nanowires.