0000000001040295

AUTHOR

S. Merchel

showing 1 related works from this author

Nondestructive full-field imaging XANES-PEEM analysis of cosmic grains

2006

For chemical analysis of submicron particles, mass spectrometric methods have the disadvantage of being destructive. Thus, a nondestructive elemental and chemical mapping with a high spatial resolution prior to mass analysis is extremely valuable to precharacterize the sample. Here, first results are presented of combined XANES (x-ray absorption near-edge structure) and PEEM (photoemission electron microscopy) measurements on a cosmic grain fraction from the Murchison meteorite. This nondestructive full-field imaging method is well suited for a quantitative analysis and for a preselection prior to detailed mass spectrometric investigations with isotopic resolution/selectivity. A spectral un…

Chemical imagingMurchison meteoritePhotoemission electron microscopyNuclear magnetic resonanceMaterials scienceComposite numberResolution (electron density)Analytical chemistryAbsorption (logic)Condensed Matter PhysicsImage resolutionXANESElectronic Optical and Magnetic MaterialsPhysical Review B
researchProduct