Low-temperature Zr mobility: An in-situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in $H_{2}O+HCl\pm SiO_{2}$ fluids

The release of Zr, U, and Pb from nearly metamict zircon and its recrystallized analog and of Zr from fully crystalline and slightly radiation-damaged zircon in H 2 O + HCl ± SiO 2 fluids was investigated in situ at temperatures between 200 and 500 °C using a hydrothermal diamond-anvil cell and time-resolved synchrotron-radiation XRF analyses. Dissolution of nearly metamict zircon proceeded much faster than that of zircon with little or no radiation damage and resulted in a 1.5 to 2 log units higher Zr molality in 6 to 7 m HCl fluids. Extensive recrystallization of the almost fully amorphous material started at 260 to 300 °C in H 2 O + HCl, and at about 360 °C if quartz was added, and was c…