0000000001165093
AUTHOR
Pierre Jacquinot
High-resolution characterization of the diffusion of light chemical elements in metallic components by scanning microwave microscopy
International audience; An original sub-surface, high spatial resolution tomographic technique based on scanning microwave microscopy (SMM) is used to visualize in-depth materials with different chemical compositions. A significant phase difference in SMM between aluminum and chromium buried patterns has been observed. Moreover this technique was used to characterize a solid solution of a light chemical element (oxygen) in a metal lattice (zirconium). The large solubility of the oxygen in zirconium leads to modifications of the properties of the solid solution that can be measured by the phase shift signal in the SMM technique. The signal obtained in cross-section of an oxidized Zr sample s…
Influence of the Residual Stresses Induced by Shot-Peening on the Oxidation of Zr Plates
The present study evaluates the influence of the residual stress on the oxidation rate of Zr at 650°C. It is shown that the oxidation rate can be substantially decreased by shot-peening. A systematic instigation of the various factors (such as the residual stress, the surface pollution and the chemical composition of the oxidation atmosphere) is realized to separate their influence on the oxidation. The influence of an annealing made after the shot-peening is also considered. One show that the pollution of the surface during the shot-peening process is not responsible for the oxidation rate decrease.