0000000001197852

AUTHOR

Frost C D

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Investigation on the Single Event Burnout threshold behaviour of Power MOSFETs under atmospheric-like neutron spectrum irradiation

2017

N-channel power MOSFETs were tested at ChipIr (ISIS-RAL) with atmospheric-like neutron spectrum. Voltage thresholds for Single Event Burnout were evaluated and their correlations with the devices characteristics (V(BR)DSS) were investigated.

Power MOSFETs Neutron SEBSettore ING-IND/20 - Misure E Strumentazione Nucleari
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