6533b86efe1ef96bd12caf8a

RESEARCH PRODUCT

Investigation on the Single Event Burnout threshold behaviour of Power MOSFETs under atmospheric-like neutron spectrum irradiation

Marchese NSolano ACazzaniga CFrost C DTomarchio EPace C

subject

Power MOSFETs Neutron SEBSettore ING-IND/20 - Misure E Strumentazione Nucleari

description

N-channel power MOSFETs were tested at ChipIr (ISIS-RAL) with atmospheric-like neutron spectrum. Voltage thresholds for Single Event Burnout were evaluated and their correlations with the devices characteristics (V(BR)DSS) were investigated.

http://hdl.handle.net/10447/275404