0000000001203303
AUTHOR
Rafal E. Dunin-borkowski
Structural and chemical characterization of CdSe-ZnS core-shell quantum dots
Abstract The structural and compositional properties of CdSe-ZnS core-shell quantum dots (QDs) with a sub-nm shell thickness are analyzed at the atomic scale using electron microscopy. QDs with both wurtzite and zinc blende crystal structures, as well as intermixing of the two structures and stacking faults, are observed. High-angle annular dark-field scanning transmission electron microscopy suggests the presence of a lower atomic number epitaxial shell of irregular thickness around a CdSe core. The presence of a shell is confirmed using energy dispersive X-ray spectroscopy. Despite the thickness irregularities, the optical properties of the particles, such as photoluminescence and quantum…
Structural and electronic properties ofβ-FeSi2nanoparticles: The role of stacking fault domains
We use conventional and aberration-corrected transmission electron microscopy (TEM) and ab initio calculations to investigate the structural and electronic properties of \ensuremath{\beta}-FeSi${}_{2}$ nanoparticles, which are a promising material for photovoltaic applications due to a band gap of 1 eV and a high absorption coefficient. The nanoparticles have average sizes of \ensuremath{\sim}20 nm, form aggregates, and are prepared by gas-phase synthesis. Amorphous SiO${}_{x}$ shells with thicknesses of \ensuremath{\sim}1.7 nm around \ensuremath{\beta}-FeSi${}_{2}$ cores are identified on individual nanoparticles using electron energy-loss spectroscopy, while stacking fault domains in the …
Structural characterization of bulk and nanoparticle lead halide perovskite thin films by (S)TEM techniques.
Lead halide (APbX3) perovskites, in polycrystalline thin films but also perovskite nanoparticles (NPs) has demonstrated excellent performance to implement a new generation of photovoltaic and photonic devices. The structural characterization of APbX3 thin films using (scanning) transmission electron microscopy ((S)TEM) techniques can provide valuable information that can be used to understand and model their optoelectronic performance and device properties. However, since APbX3 perovskites are soft materials, their characterization using (S)TEM is challenging. Here, we study and compare the structural properties of two different metal halide APbX3 perovskite thin films: bulk CH3NH3PbI3 prep…
Interfacial Oxide Modulated unique Exchange Bias in CrPS4/Fe3GeTe2 van der Waals heterostructures
Two-dimensional van der Waals heterostructures are an attractive platform for studying exchange bias due to their defect free and atomically flat interfaces. Chromium thiophosphate (CrPS4), an antiferromagnet, has uncompensated magnetic spins in a single layer that make it an excellent candidate for studying exchange bias. In this study, we examined the exchange bias in CrPS4/Fe3GeTe2 van der Waals heterostructures using anomalous Hall measurements. Our results show that the exchange bias strength is robust for clean interfaces, with a hysteresis loop shift of about 55 mT at 5 K for few-layer Fe3GeTe2, which is larger than that obtained in most van der Waals AFM/FM heterostructures. However…