Nanoscale mechanical characterization of polymers by atomic force microscopy (AFM) nanoindentations: Viscoelastic characterization on a model material

The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for the characterization of the local mechanical properties of polymers. In fact, the elastic characterization of purely elastic materials using this instrument can be considered as a well assessed technique while the challenge remains the characterization of the viscoelastic mechanical properties. In particular, one finds the mechanical behavior changing when performing indentations at different loading rates, i.e., on different time scales. Moreover, this apparent viscoelastic behavior can also be due to complex contact mechanics phenomena, with the onset of plasticity and long-term viscoelast…