0000000001301237
AUTHOR
I. Muzikante
Object size effect on the contact potential difference measured by scanning Kelvin probe method
International audience; Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.
CCDC 699927: Experimental Crystal Structure Determination
Related Article: J.Tsutsumi, T.Sasamori, H.Yoshida, N.Tokitoh, N.Sato, S.Kato, I.Muzikante, O.Neilands|2009|J.Mol.Struct.|920|52|doi:10.1016/j.molstruc.2008.10.021
CCDC 699925: Experimental Crystal Structure Determination
Related Article: J.Tsutsumi, T.Sasamori, H.Yoshida, N.Tokitoh, N.Sato, S.Kato, I.Muzikante, O.Neilands|2009|J.Mol.Struct.|920|52|doi:10.1016/j.molstruc.2008.10.021
CCDC 699924: Experimental Crystal Structure Determination
Related Article: J.Tsutsumi, T.Sasamori, H.Yoshida, N.Tokitoh, N.Sato, S.Kato, I.Muzikante, O.Neilands|2009|J.Mol.Struct.|920|52|doi:10.1016/j.molstruc.2008.10.021
CCDC 699926: Experimental Crystal Structure Determination
Related Article: J.Tsutsumi, T.Sasamori, H.Yoshida, N.Tokitoh, N.Sato, S.Kato, I.Muzikante, O.Neilands|2009|J.Mol.Struct.|920|52|doi:10.1016/j.molstruc.2008.10.021