0000000001305651

AUTHOR

A. Abate

An improved MSD-based method for PD defects classification

The new proposed method of pattern recognition is based on the application of Multi-resolution Signal Decomposition (MSD) technique of wavelet transform. This technique has showed off interesting properties in capturing the embedded horizontal, vertical and diagonal variations within an image obtained from the PD pattern in a separable form. This feature was exploited to identify in the PD pattern's MSD, relative at various family of partial discharge sources, some detail images typical of a single discharge phenomenon. The classification of a generic PD phenomenon is feasible through a comparison between its detail images and the detail images typical of a single discharge phenomenon. Test…

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DWT-based method for partial discharge (PD) defects classification

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CCDC 755088: Experimental Crystal Structure Determination

Related Article: L.Meazza, J.Marti-Rujas, G.Terraneo, C.Castiglioni, A.Milani, T.Pilati, P.Metrangolo, G.Resnati|2011|CrystEngComm|13|4427|doi:10.1039/c1ce05050h

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CCDC 743342: Experimental Crystal Structure Determination

Related Article: A.Abate, M.Brischetto, G.Cavallo, M.Lahtinen, P.Metrangolo, T.Pilati, S.Radice, G.Resnati, K.Rissanen, G.Terraneo|2010|Chem.Commun.|46|2724|doi:10.1039/b924423a

research product

CCDC 755087: Experimental Crystal Structure Determination

Related Article: A.Abate, M.Brischetto, G.Cavallo, M.Lahtinen, P.Metrangolo, T.Pilati, S.Radice, G.Resnati, K.Rissanen, G.Terraneo|2010|Chem.Commun.|46|2724|doi:10.1039/b924423a

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