0000000001309024
AUTHOR
J. Heino
Radiation Shielding Study of Advanced Data and Power Management Systems (ADPMS) Housing Using Geant4
The tendency to reduce the spacecraft mass covers nowadays all components of the spacecraft. One potential target is to reduce the mass of electronics and its housings. The use of composite materials, especially CFRP is a well known and vastly used approach to mass reduction. In cost reduction the use of standard (non-space qualified) electronics has increased. These commercial circuits and other components cannot tolerate as high radiation levels as space qualified components. Therefore the use of standard electronics components poses challenge in terms of the radiation protection capability of the ADPMS housings. The main goal of this study is to give an insight on the radiation shielding…
Improved stability of black silicon detectors using aluminum oxide surface passivation
Publisher Copyright: © 2021 ESA and CNES We have studied how high-energy electron irradiation (12 MeV, total dose 66 krad(Si)) and long term humidity exposure (75%, 75 °C, 500 hours) influence the induced junction black silicon or planar photodiode characteristics. In our case, the induced junction is formed using n-type silicon and atomic-layer deposited aluminum oxide (Al2O3), which contains a large negative fixed charge. We compare the results with corresponding planar pn-junction detectors passivated with either with silicon dioxide (SiO2) or Al2O3. The results show that the induced junction detectors remain stable as their responsivity remains nearly unaffected during the electron beam…
CCDC 809191: Experimental Crystal Structure Determination
Related Article: J.T.Koivunen, L.Nissinen, J.Kapyla, J.Jokinen, M.Pihlavisto, A.Marjamaki, J.Heino, J.Huuskonen, O.T.Pentikainen|2011|J.Am.Chem.Soc.|133|14558|doi:10.1021/ja206086c
CCDC 809192: Experimental Crystal Structure Determination
Related Article: J.T.Koivunen, L.Nissinen, J.Kapyla, J.Jokinen, M.Pihlavisto, A.Marjamaki, J.Heino, J.Huuskonen, O.T.Pentikainen|2011|J.Am.Chem.Soc.|133|14558|doi:10.1021/ja206086c