6533b7cffe1ef96bd1257c8e

RESEARCH PRODUCT

Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis

Antonino D'alessandroR. D'annaAntonio CostanzaAdriano FagioliniSalvatore ScuderoGiovanni VitaleLuca Greco

subject

Microelectromechanical systemsEngineering010504 meteorology & atmospheric sciencesbusiness.industrySpectral densityLow frequency010502 geochemistry & geophysicsAccelerometer01 natural sciencesCharacterization (materials science)AccelerationSettore ING-INF/04 - AutomaticaElectronic engineeringAllan varianceAccelerometers Micromechanical devices Standards Earthquakes Acceleration Monitoring Inertial navigationbusinessInertial navigation system0105 earth and related environmental sciences

description

In this paper, we have studied the sources of error of a low-cost 3-axis MEMS accelerometer by means of Power Spectral Density and Allan Variance techniques. These techniques were applied to the signals acquired from ten identical devices to characterize the variability of the sensor produced by the same manufacturer. Our analysis showed as identically produced accelerometer have somehow variable behavior in particular at low frequency. It is therefore of paramount importance before their use in Inertial Navigation or Earthquakes Monitoring System, a complete characterization of each single sensors.

yearjournalcountryeditionlanguage
2017-06-012017 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)
https://doi.org/10.1109/iwasi.2017.7974238