6533b7d4fe1ef96bd126270e

RESEARCH PRODUCT

Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing

Aldo ParlatoLetizia FragomeniD. FioreN MarcheseCalogero PaceAndrea Solano

subject

Set (abstract data type)CMOSComputer scienceFeature (computer vision)Total doseElectronic engineeringLow dose rateElectronic circuit

description

In this paper, the planning of low dose-rate, high total dose testing campaign for I/O circuits is reported. In particular, the paper describes all development steps, starting from the rad-hard I/O circuits design and the implementation of the test-chip, which is meant to allow comparative testing between rad-hard and standard devices. The designed experimental setup permits in situ measurements, therefore the circuits behavior can be remotely monitored for very long periods. This feature enables low dose-rate testing up to very high dose.

yearjournalcountryeditionlanguage
2017-06-04
https://doi.org/10.1007/978-3-319-55071-8_4