6533b7d5fe1ef96bd1263b9f
RESEARCH PRODUCT
Characterization of SiPM properties at liquid nitrogen temperature
M. BirothPatrick AchenbachWerner LauthAndreas Thomassubject
Materials scienceSiliconPhysics::Instrumentation and Detectors010308 nuclear & particles physicsbusiness.industrychemistry.chemical_elementCryogenicsLiquid nitrogen01 natural sciencesSpectral linelaw.inventionSilicon photomultiplierchemistrylaw0103 physical sciencesOptoelectronicsBreakdown voltagePhotonicsResistorbusinessdescription
SiPM operation at cryogenic temperatures fails for many common devices. A particular type with deep channels in the silicon substrate instead of quenching resistors was thoroughly characterized from room temperature down to liquid nitrogen temperature by illuminating it with low light levels. The devices were mounted in vacuum with the temperature stabilized to allow long-term operation. SiPM signals from a LED pulser were acquired with single-pixel resolution. Generalized fits to the charge collection spectra were used to extract properties like single-pixel gain, inter-pixel variation, breakdown voltage, and photon detection efficiency. With these measurements a deeper investigation of the influence of cryogenic temperatures on the SiPM properties was possible.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2016-10-01 | 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) |