6533b7d5fe1ef96bd1264707
RESEARCH PRODUCT
Optically Enhanced Electric Field Sensing Using Nitrogen-Vacancy Ensembles
Joaquin MinguzziDmitry BudkerDmitry BudkerVictor M. AcostaSatcher HsiehSatcher HsiehAndrey JarmolaAndrey JarmolaMaxwell BlockJeronimo R. MazeNataniel L. FigueroaNataniel L. FigueroaChong ZuNorman Y. YaoNorman Y. YaoBryce KobrinBryce Kobrinsubject
Materials scienceFOS: Physical sciencesGeneral Physics and Astronomychemistry.chemical_element02 engineering and technologyengineering.material01 natural sciencesNoise (electronics)Vacancy defectElectric fieldMesoscale and Nanoscale Physics (cond-mat.mes-hall)0103 physical sciencesddc:530Sensitivity (control systems)010306 general physicsQuantum PhysicsCondensed Matter - Mesoscale and Nanoscale Physicsbusiness.industryDiamondCharge (physics)021001 nanoscience & nanotechnologyScaling theoryNitrogenchemistryengineeringOptoelectronicsQuantum Physics (quant-ph)0210 nano-technologybusinessdescription
Nitrogen-vacancy (NV) centers in diamond have shown promise as inherently localized electric-field sensors, capable of detecting individual charges with nanometer resolution. Working with NV ensembles, we demonstrate that a detailed understanding of the internal electric field environment enables enhanced sensitivity in the detection of external electric fields. We follow this logic along two complementary paths. First, using excitation tuned near the NV's zero-phonon line, we perform optically detected magnetic resonance (ODMR) spectroscopy at cryogenic temperatures in order to precisely measure the NV center's excited-state susceptibility to electric fields. In doing so, we demonstrate that the characteristically observed contrast inversion arises from an interplay between spin-selective optical pumping and the NV centers' local charge distribution. Second, motivated by this understanding, we propose and analyze a novel scheme for optically-enhanced electric-field sensing using NV ensembles; we estimate that our approach should enable order of magnitude improvements in the DC electric-field sensitivity.
year | journal | country | edition | language |
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2021-08-13 | Physical Review Applied |