6533b7d6fe1ef96bd1265a88
RESEARCH PRODUCT
Zn K-edge XANES in nanocrystalline ZnO
S. LarcheriAlexei KuzminF. Roccasubject
HistoryX-ray spectroscopyMaterials scienceAbsorption spectroscopyInorganic chemistryAnalytical chemistryAb initiochemistry.chemical_elementZincXANESNanocrystalline materialComputer Science ApplicationsEducationK-edgechemistryCrystallitedescription
Zn K-edge XANES in ZnO has been calculated within the full-multiple-scattering (FMS) and finite difference method (FDM) formalism using the ab initio FDMNES code. The influence of non-muffin-tin potential, bulk defects, surface termination and polarization effects on XANES has been analysed. The obtained theoretical results are compared with available experimental data for polycrystalline and nanocrystalline zinc oxide systems.
year | journal | country | edition | language |
---|---|---|---|---|
2007-12-01 | Journal of Physics: Conference Series |