0000000000243824
AUTHOR
S. Larcheri
X-Ray studies on optical and structural properties of ZnO nanostructured thin films
Abstract X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield…
Zn K-edge XANES in nanocrystalline ZnO
Zn K-edge XANES in ZnO has been calculated within the full-multiple-scattering (FMS) and finite difference method (FDM) formalism using the ab initio FDMNES code. The influence of non-muffin-tin potential, bulk defects, surface termination and polarization effects on XANES has been analysed. The obtained theoretical results are compared with available experimental data for polycrystalline and nanocrystalline zinc oxide systems.
Short-range order around Er3+ in silica waveguides containing aluminium, titanium and hafnium
Er3+-doped silica waveguides, co-doped with aluminium, titanium, and hafnium oxides, were prepared using the sol-gel method and dip-coating processing. Here, we present a characterisation of the local environment around Er3+ ions, as determined from the Er L3-edge extended X-ray absorption fine structure (EXAFS) measurements performed at ESRF (France). The first coordination shell is composed of 5-6 oxygen atoms at distances ~2.32-2.35 A , slightly varying as a function of the modifier oxide. Er3+ nearest neighbors distance does not show a significant compositional dependence. On the contrary, outer shells analysis shows significant differences: Al2O3 doping (less than 2% mol) induces an or…
Nanoscale x-ray absorption spectroscopy using XEOL-SNOM detection mode
The first results obtained with the prototype system at the synchrotron beamline ID03 at ESRF are presented and illustrate the possibility to detect an element-specific contrast and to perform nanoscale x-ray absorption spectroscopy experiments at the Zn K and W L 3 absorption edges in mixed zinc oxide-zinc tungstate thin films.
A new tool for nanoscale X-ray absorption spectroscopy and element-specific SNOM microscopy.
Abstract Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of X-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning near-field optical microscopy (SNOM) detection of the X-ray excited optical luminescence (XEOL) signal. The first results obtained with the prototype instrumentation installed at the European Synchrotron Radiation Facility (Grenoble, France) are presented. They illustrate the possibi…