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RESEARCH PRODUCT
X-Ray studies on optical and structural properties of ZnO nanostructured thin films
R. GraziolaAlexei KuzminFranck JandardR. KalendarevJuris PuransD. PailhareyCristina ArmelliniF. RoccaS. LarcheriGiuseppe Dalbasubject
010302 applied physicsMaterials sciencePhotoluminescencebusiness.industryX-rayAnalytical chemistrySynchrotron radiation02 engineering and technologyChemical vapor deposition021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesXANESOptics0103 physical sciencesGeneral Materials ScienceElectrical and Electronic EngineeringThin film0210 nano-technologybusinessLuminescenceSpectroscopydescription
Abstract X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the structural and optical properties of ZnO nanostructured samples.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2006-01-01 |