6533b7d6fe1ef96bd126628d
RESEARCH PRODUCT
Etude en champ proche et champ lointain de surfaces métalliques : apport des microscopies à sonde locale à l'étude des étalons de masse
Haidar Youssefsubject
étalon de masseshear-force regulationMicroscopie en champ procherégulation shear-forcestandard mass.[PHYS.PHYS] Physics [physics]/Physics [physics]rugosité[ PHYS.PHYS ] Physics [physics]/Physics [physics]Scanning near field microscoperoughnessétalon de masse.description
Among the international system of units (SI) the kilogram is the only one which is still defined by a material artefact, the international prototype of the platinum iridium kilogram. The instability of mass standards is one of the major concerns of national metrology institutes and the subject of numerous studies. Interest in microscopic studies of surface quality of a mass has grown, as it is well known that surface roughness is a factor in determining the long-term stability of mass standards. This thesis is devoted to the study in near field and far field for determining the topography and roughness of metallic surfaces, in related with different institute, national and international metrology laboratories. An important part of this thesis is devoted to the application of the SNOM and ShFM. The great interest here is that the ShFM provide a topographical image of the surface under study while the SNOM can provide an optical image of the same surface with high resolution.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-06-15 |