6533b7d7fe1ef96bd1268309
RESEARCH PRODUCT
Estimation of band alignment at CdS/Cu 2 ZnSnS 4 hetero‐interface by direct XPS measurements
M. AdnaneOlivier HeintzDenis ChaumontCharif TaminCharif Taminsubject
Materials sciencebusiness.industryInterface (computing)Surfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsSurfaces Coatings and Filmschemistry.chemical_compoundX-ray photoelectron spectroscopychemistryMaterials ChemistryOptoelectronicsCZTSbusiness| year | journal | country | edition | language |
|---|---|---|---|---|
| 2020-09-22 | Surface and Interface Analysis |