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RESEARCH PRODUCT

Ac field dependence of the susceptibility of Bi2Sr2CaCu2O8 thin films at low dc fields

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We have measured the ac field dependence of the ac susceptibility of 400 nm thick Bi2212 thin films at low dc fields 0 ≤μ0Ha ≤ 1 mT in transverse geometry. We show that at reduced temperaturest≤0.85 the ac field dependence can be described by the non-linear Bean model after Brandt as in Y123 thin films. Att>0.85, however, we observe a decrease of the energy dissipation and shielding capability. The critical current density at zero dc field is given byjc−4×1010(1−(T/Tc))2.8±0.1 A/m2.