6533b7dcfe1ef96bd127328b
RESEARCH PRODUCT
Impurity analyses of silicon wafers from different manufacturing routes and their impact on LID of finished solar cells
Jan Ove OddenMuhammad TayyibPirmin PreisTor Oskar Saetresubject
Materials scienceintegumentary systemPassivationSiliconHydrogenMetallurgytechnology industry and agriculturechemistry.chemical_elementcomplex mixturesPolymer solar cellMonocrystalline siliconchemistryImpurityWaferCarbondescription
Summarizes the measurements of impurity concentrations in directionally solidified silicon ingots from different feedstocks. The substitutional Carbon and interstitial Oxygen are measured on as-sawn wafers using FTIR. Active iron concentration is mapped on a-Si:H passivated wafers. It is observed that these impurities present in Elkem Solar Grade Silicon (ESS™) concentrations are comparable to the standard polysilicon which are in the acceptable ranges for silicon for solar industry. The measured LID of the finished solar cells is also comparable.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-06-01 | 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) |