6533b821fe1ef96bd127ac6e
RESEARCH PRODUCT
<title>Changes in the temperature dependence of the dielectric constant in irradiated antiferroelectric thin films</title>
R. BittnerAndris SternbergHarald W. WeberYuri V. TrushinKarl HumerDmitry A. LesnyhDmitry V. Kulikovsubject
Materials scienceCondensed matter physicsbusiness.industryNeutron fluxSchottky effectOptoelectronicsSchottky diodeAntiferroelectricityNeutronIrradiationDielectricThin filmbusinessdescription
A model describing the changes of the Curie-Weiss temperature in lead-zirconate thin films under neutron irradiation is proposed. The Curie-Weiss temperature in the irradiated material decreases which is connected to charges caused by neutron irradiation. The charges located near the surfaces due to Schottky effect and in the bulk of the film results in different rates of the Curie-Weiss temperature decreases with neutron fluence. However the influence of the Schottky layers seems to be more pronounced. Satisfactory agreement between the theoretical results and the experimental data is obtained for different neutron fluences.© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2003-10-08 | SPIE Proceedings |