6533b821fe1ef96bd127c090
RESEARCH PRODUCT
Particle Characterization Using Multiple Scattering Decorrelation Methods. Part 1: Standard Latex Particles
Ralf NiehüserChristian SinnThomas PalbergEkkehard Overbecksubject
ScatteringChemistrybusiness.industryMultiangle light scatteringGeneral ChemistryCondensed Matter PhysicsLight scatteringOpticsAnalytical light scatteringParticleGeneral Materials ScienceStatic light scatteringBiological small-angle scatteringbusinessDecorrelationyear | journal | country | edition | language |
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1999-08-01 | Particle & Particle Systems Characterization |