6533b822fe1ef96bd127d2b5
RESEARCH PRODUCT
Physico-Chemical Characterization of Ta2O5 Thin Films/Electrolyte Junctions
Viviana Figa'subject
Electronic propertiesTantalumdescription
An analysis of the electronic properties of Ta2O5 / electrolyte junction is reported for thin film (≤ 14 nm) grown on tantalum in acidic electrolyte. The investigation is carried out by the synergetic use of three techniques: Photocurrent Spectroscopy (PCS), Electrochemical Impedance Spectroscopy (EIS) and Differential Admittance (DA) measurements. PCS is a non destructive optical technique based on the analysis of the electrochemical response (photocurrent or photopotential) of the electrode/electrolyte interface under irradiation with photons of suitable energy. PCS can provide information on the energetic of metal/oxide/electrolyte interfaces (flat band potential determination, conduction and valence band edges location). EIS allows to model the electrochemical behaviour of the oxide/electrolyte interface and DA measurements allow to get information on the tantalum grown in the investigated conditions.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2007-01-01 |