6533b823fe1ef96bd127eb78

RESEARCH PRODUCT

A Scanning Electron Microscope for Ultracold Atoms

C. UtfeldHerwig OttN HommerstadTatjana Gericke

subject

Condensed Matter::Quantum GasesMaterials scienceStatistical Mechanics (cond-mat.stat-mech)Physics and Astronomy (miscellaneous)Scanning confocal electron microscopyFOS: Physical sciencesElectron tomographyUltracold atomScanning transmission electron microscopyPhysics::Atomic and Molecular ClustersEnergy filtered transmission electron microscopyPhysics::Atomic PhysicsElectron beam-induced depositionAtomic physicsHigh-resolution transmission electron microscopyInstrumentationEnvironmental scanning electron microscopeCondensed Matter - Statistical Mechanics

description

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

yearjournalcountryeditionlanguage
2006-07-14
10.1002/lapl.200610028http://arxiv.org/abs/cond-mat/0607358