6533b823fe1ef96bd127f3da
RESEARCH PRODUCT
Optical Gradient of the Trapezium-Shaped NaNbO[sub 3] Thin Films Studied by Spectroscopic Ellipsometry
K. KundzinsVismants ZaulsIlze AulikaAlexandr Dejnekasubject
Materials scienceRenewable Energy Sustainability and the Environmentbusiness.industrySurface finishPhoton energyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsOpticsMaterials ChemistryElectrochemistrySpectroscopic ellipsometryThin filmbusinessRefractive indexdescription
thin films were performed in the photon energy range of 1.24–4.96 eV.Effective values of the complex refractive index and thickness nonuniformity, roughness, and depth profile of the real part of therefractive index were evaluated. An increase of the refractive index with increasing of the sample thickness was observed anddiscussed.© 2008 The Electrochemical Society. DOI: 10.1149/1.2965786 All rights reserved.Manuscript submitted May 27, 2008; revised manuscript received July 7, 2008. Published August 19, 2008.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2008-01-01 | Journal of The Electrochemical Society |