0000000000280766
AUTHOR
Alexandr Dejneka
Local structure studies of SrTi16O3and SrTi18O3
In this work we report on the local structure of Ti in SrTi 16 O3 (STO16) and SrTi 18 O3 (STO18) investigated in the low temperature range (6‐300K) by extended x-ray absorption fine structure and x-ray absorption near edge structure (XANES) spectroscopy at Ti K-edge and by optical second harmonic generation (SHG). By comparing XANES of STO16 and STO18 we have identified the isotopic effect which produces at T < 100K a noticeable difference in the measured mean square relative displacements (MSRD) of Ti‐O1 bonds: while STO16 follow the expected Einstein-like behavior, for STO18 we have measured an increase of MSRD values with decreasing temperature. This is an indication of an increasing off…
The nature of the defect structure of solid solutions based on lead zirconate titanate (PZT): Evidence from EPR and NMR
The nature of intrinsic and impurity point defects in lead zirconate titanate (PZT) ceramics has been explored. Using electron paramagnetic resonance (EPR) and nuclear magnetic resonance (NMR) methods several impurity sites have been identified in the materials, including Fe3+-oxygen vacancy (VO) complex and Pb ions. Both of these centers are incorporated into the PZT lattice. The Fe3+-VO paramagnetic complex serves as a sensitive probe of the local crystalline field in the ceramic; the symmetry of this defect is roughly correlated with PZT phase diagram as composition is varied from PbTiO3 to PbZrO3. NMR spectra 207Pb in PbTiO3, PbZrO3 and PZT with iron content from 0 to 0.4 mol % showed t…
Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles psi and Delta, for the detection of phase transitions. The efficiency of spectroscopic ellipsometry on "surface" phase transition and its sensitivity to surface defects are also demonstrated.
Formation of Optical Gradient in Chemical Solution-Derived PbZr[sub 0.52]Ti[sub 0.48]O[sub 3] Thin Films: Spectroscopic Ellipsometry Investigation
Investigation using a variable angle spectroscopic ellipsometer revealed the influence of sample preparation conditions on sol-gel PbZr 0.52 Ti 0.48 O 3 (PZT 52/48) thin-film homogeneity that allows identification and further optimization of thin-film performance. Separate crystallization of the layers determined the optical gradient appearance, irrespective of the chemical solvents used in this work. A more refined analysis showed that a refractive index gradient was apparent in the samples in which lattice parameters strongly changed with thickness. For these films, energy-dispersive X-ray spectroscopy analysis showed significant variation in Pb and Zr. Additionally, complex dielectric fu…
Optical Gradient of the Trapezium-Shaped NaNbO[sub 3] Thin Films Studied by Spectroscopic Ellipsometry
thin films were performed in the photon energy range of 1.24–4.96 eV.Effective values of the complex refractive index and thickness nonuniformity, roughness, and depth profile of the real part of therefractive index were evaluated. An increase of the refractive index with increasing of the sample thickness was observed anddiscussed.© 2008 The Electrochemical Society. DOI: 10.1149/1.2965786 All rights reserved.Manuscript submitted May 27, 2008; revised manuscript received July 7, 2008. Published August 19, 2008.
Thermo‐optical investigations of NaNbO 3 thin films by spectral ellipsometry
In this work a spectroscopic ellipsometry was applied to the thermo-optical investigations of sodium niobate NaNbO3 (NN) thin films at the wide temperature range of 5–820 K. The temperature dependence of complex refractive index dispersions and optical bang energy of the direct allowed electron transitions were evaluated. Additionally dynamic scans of the main ellipsometric angles at the several fixed wave lengths of 300, 400, 500 and 635 nm were performed to acquire more detailed temperature dependences of the refractive index and extinction coefficient. Pronounced minima/maxima and substantial jumps in the temperature dependence of complex refractive index and band gap energy were found a…
Compositional and Optical Gradient in Films of PbZrxTi1-xO3 (PZT) Family
Pb(ZrxTi1-x)O3 (PZT) (x = 0-1) films have attracted the attention of researchers for the past 30 years due to their excellent ferroelectric (FE) and electromechanical properties, which have led to the commercialization of thin PZT films for ferroelectric random access memory (FeRAM), forming a market of several millions USD annually. Ferroelectricity of perovskite oxide thin films, especially PZT thin films, can be exploited in semiconductor devices to achieve non-volatile random access memory (NVRAM) with high-speed access and long endurance, which can overcome the barriers, encountered in current semiconductor memory technologies. The ferroelectricity can be also exploited to voltage depe…
Local Structure Studies of Ti for SrTi16O3 and SrTi18O3 by Advanced X-ray Absorption Spectroscopy Data Analysis
Strontium titanate is a model quantum paraelectric in which in the region of dominating quantum statistics the ferroelectric instability is inhibited due to nearly complete compensation of the harmonic contribution into ferroelectric soft mode frequency by the zero-point motion contribution. The enhancement of atomic masses by the substitution of 18O for 16O decreases the zero-point atomic motion and low-T ferroelectricity in SrTi18O3 is realized. In this study we report on the local structure of Ti in SrTi16O3 and SrTi18O3 by Ti K-edge extended x-ray absorption fine structure measurements in temperature range 6 – 300 K.
Optical Spectra and Direct Optical Transitions in Amorphous and Crystalline ZnO Thin Films and Powders
Comparative studies of ZnO crystalline and amorphous thin films and nanocrystalline powders are reported. The UV-visible optical spectra were analyzed with special attention paid to the direct optical bandgap. Atmospheric radio-frequency barrier torch discharge and pulsed hollow cathode sputtering techniques for the film fabrication were used. For the crystalline films, similar values of the direct optical bandgap were found independent of the growth method used. The analysis of the amorphous films and powders revealed a pronounced Urbach-like exponential absorption tail approaching the bandedge. For the powders, the bandgap energies were larger than those for the crystalline and amorphous …