6533b7dafe1ef96bd126f451
RESEARCH PRODUCT
Formation of Optical Gradient in Chemical Solution-Derived PbZr[sub 0.52]Ti[sub 0.48]O[sub 3] Thin Films: Spectroscopic Ellipsometry Investigation
Marija KosecQi ZhangIlze AulikaAndreja BenčanS. D’astorgS. CorkovicAlexandr DejnekaVismants Zaulssubject
Materials scienceRenewable Energy Sustainability and the EnvironmentAnalytical chemistryDielectricCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionlawEllipsometryHomogeneity (physics)Materials ChemistryElectrochemistrySample preparationThin filmCrystallizationSpectroscopyRefractive indexdescription
Investigation using a variable angle spectroscopic ellipsometer revealed the influence of sample preparation conditions on sol-gel PbZr 0.52 Ti 0.48 O 3 (PZT 52/48) thin-film homogeneity that allows identification and further optimization of thin-film performance. Separate crystallization of the layers determined the optical gradient appearance, irrespective of the chemical solvents used in this work. A more refined analysis showed that a refractive index gradient was apparent in the samples in which lattice parameters strongly changed with thickness. For these films, energy-dispersive X-ray spectroscopy analysis showed significant variation in Pb and Zr. Additionally, complex dielectric functions for each PZT 52/48 thin film in the wide phonon energy (1.03-5.39 eV) range were evaluated.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2009-01-01 | Journal of The Electrochemical Society |