0000000000364814
AUTHOR
Marija Kosec
showing 2 related works from this author
Formation of Optical Gradient in Chemical Solution-Derived PbZr[sub 0.52]Ti[sub 0.48]O[sub 3] Thin Films: Spectroscopic Ellipsometry Investigation
2009
Investigation using a variable angle spectroscopic ellipsometer revealed the influence of sample preparation conditions on sol-gel PbZr 0.52 Ti 0.48 O 3 (PZT 52/48) thin-film homogeneity that allows identification and further optimization of thin-film performance. Separate crystallization of the layers determined the optical gradient appearance, irrespective of the chemical solvents used in this work. A more refined analysis showed that a refractive index gradient was apparent in the samples in which lattice parameters strongly changed with thickness. For these films, energy-dispersive X-ray spectroscopy analysis showed significant variation in Pb and Zr. Additionally, complex dielectric fu…
Interface Effects in Ferroelectric Thin Films
1998
Dielectric, ferroelectric and piezoelectric characteristics in sol-gel derived and pulsed laser deposited (PLD) lead zirconate titanate (PZT), La modified lead titanate (PLT) and zirconate titanate (PLZT) ferroelectric thin films are investigated focusing on maintenance of thin film ferroelectric (FE) properties in a variety of thin film-electrodesubstrate interfaces. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to a DC electrical bias and AC measurement frequency. The asymmetry of piezoelectric coefficient (d33) hysteresis, diminished values of d33, frequency-displacement and spot size — deformation behaviour in the ferroelectric het…