6533b7d9fe1ef96bd126d680
RESEARCH PRODUCT
Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
Jaromir KrepelkaAnna LynnykLubomir JastrabikAlexandr DejnekaZdenek HubickaIlze AulikaV. A. Trepakovsubject
Phase transitionMaterials sciencebusiness.industryBand gapSpectrum AnalysisPhysics::OpticsPhase TransitionAtomic and Molecular Physics and OpticsPulsed laser depositionRefractometryLight intensityOpticsModels ChemicalAttenuation coefficientSurface roughnessComputer SimulationPowdersThin filmbusinessRefractive indexAlgorithmsdescription
The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles psi and Delta, for the detection of phase transitions. The efficiency of spectroscopic ellipsometry on "surface" phase transition and its sensitivity to surface defects are also demonstrated.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2009-08-06 | Optics Express |