0000000000302944
AUTHOR
Lubomir Jastrabik
The nature of the defect structure of solid solutions based on lead zirconate titanate (PZT): Evidence from EPR and NMR
The nature of intrinsic and impurity point defects in lead zirconate titanate (PZT) ceramics has been explored. Using electron paramagnetic resonance (EPR) and nuclear magnetic resonance (NMR) methods several impurity sites have been identified in the materials, including Fe3+-oxygen vacancy (VO) complex and Pb ions. Both of these centers are incorporated into the PZT lattice. The Fe3+-VO paramagnetic complex serves as a sensitive probe of the local crystalline field in the ceramic; the symmetry of this defect is roughly correlated with PZT phase diagram as composition is varied from PbTiO3 to PbZrO3. NMR spectra 207Pb in PbTiO3, PbZrO3 and PZT with iron content from 0 to 0.4 mol % showed t…
Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles psi and Delta, for the detection of phase transitions. The efficiency of spectroscopic ellipsometry on "surface" phase transition and its sensitivity to surface defects are also demonstrated.
Compositional and Optical Gradient in Films of PbZrxTi1-xO3 (PZT) Family
Pb(ZrxTi1-x)O3 (PZT) (x = 0-1) films have attracted the attention of researchers for the past 30 years due to their excellent ferroelectric (FE) and electromechanical properties, which have led to the commercialization of thin PZT films for ferroelectric random access memory (FeRAM), forming a market of several millions USD annually. Ferroelectricity of perovskite oxide thin films, especially PZT thin films, can be exploited in semiconductor devices to achieve non-volatile random access memory (NVRAM) with high-speed access and long endurance, which can overcome the barriers, encountered in current semiconductor memory technologies. The ferroelectricity can be also exploited to voltage depe…
Using the methods of radiospectroscopy (EPR, NMR) to study the nature of the defect structure of solid solutions based on lead zirconate titanate (PZT)
The nature of intrinsic and impurity point defects in lead zirconate titanate (PZT) ceramics has been explored. Using electron paramagnetic resonance (EPR), nuclear magnetic resonance (NMR), and X-ray photoelectron spectroscopy (XPS) methods, several impurity sites have been identified in the materials, including the Fe 3+ -oxygen vacancy (VO) complex and Pb ions. Both of these centers are incorporated into the PZT lattice. The Fe 3+ -V paramagnetic complex serves as a sensitive probe of the local crystal field in the ceramic; the symmetry of this defect roughly correlates with PZT phase diagram as the composition is varied from PbTiO 3 to PbZrO 3 . NMR spectra 207 Pb in PbTiO 3 , PbZrO 3 ,…
Size effects of static and dynamic polarization in ferroelectric thin film multilayers
Abstract A thermodynamic theory for the calculation of static and dynamic polarization profiles of ferroelectric thin film multilayers is developed. The free energy functional is written down using a multilayer model in which c-domain layers of the ferroelectric material alternate with a-domain layers of a second ferroelectric materials. We assume that the interfaces are perfectly sharp and that the polarization at these boundaries is zero. The equilibrium polarization profile, its temperature and thickness dependencies were determined from the solutions of the Euler-Lagrange equations. A thickness induced ferroelectric phase transition is shown to exist and its transition temperature and c…
Optical Spectra and Direct Optical Transitions in Amorphous and Crystalline ZnO Thin Films and Powders
Comparative studies of ZnO crystalline and amorphous thin films and nanocrystalline powders are reported. The UV-visible optical spectra were analyzed with special attention paid to the direct optical bandgap. Atmospheric radio-frequency barrier torch discharge and pulsed hollow cathode sputtering techniques for the film fabrication were used. For the crystalline films, similar values of the direct optical bandgap were found independent of the growth method used. The analysis of the amorphous films and powders revealed a pronounced Urbach-like exponential absorption tail approaching the bandedge. For the powders, the bandgap energies were larger than those for the crystalline and amorphous …