Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles psi and Delta, for the detection of phase transitions. The efficiency of spectroscopic ellipsometry on "surface" phase transition and its sensitivity to surface defects are also demonstrated.
Thermo‐optical investigations of NaNbO 3 thin films by spectral ellipsometry
In this work a spectroscopic ellipsometry was applied to the thermo-optical investigations of sodium niobate NaNbO3 (NN) thin films at the wide temperature range of 5–820 K. The temperature dependence of complex refractive index dispersions and optical bang energy of the direct allowed electron transitions were evaluated. Additionally dynamic scans of the main ellipsometric angles at the several fixed wave lengths of 300, 400, 500 and 635 nm were performed to acquire more detailed temperature dependences of the refractive index and extinction coefficient. Pronounced minima/maxima and substantial jumps in the temperature dependence of complex refractive index and band gap energy were found a…